aspenONE Process Explorer: Using and Configuring

Course Id:  MES121   |   Duration:  3.00 day(s)   |   CEUs Awarded:  2.1   |   Level:  Introductory

Course Objective

View data coming from your process using aspenONE Process Explorer. Customize the appearance of trend plots to suit your application. Specify plots based on statistical analysis of process data (aggregates). Exploit all the features offered by aspenONE Process Explorer concerning process data trending and graphic creation/viewing. Integrate real-time or historic data from your process into Windows desktop programs, e.g., Microsoft Excel. Effectively monitor the usage of your equipment by viewing a variety of Overall Equipment Effectiveness (OEE) charts. Configure Alarm Alerts and Alert Subscription to monitor your process variables and make sure they stay within defined specs. View KPI hierarchies defined in Manufacturing Master Data Manager (mMDM) to ensure the company is meeting its goals.
 

Benefits

  • Gain access to your process data stored in Aspen InfoPlus.21 without the need to study detailed database functionality 
  • Learn how data accessibility can improve productivity
  • Understand the potential and benefits of key management decisions made faster with timely availability of appropriate process information

Audience

  • Process Operators, Engineers, and Managers responsible for troubleshooting, optimizing, or reporting a process monitored by Aspen InfoPlus.21
  • Process Graphic Designers responsible for developing a graphical representation of a process unit or equipment

Approach

  • Learn how to use aspenONE Process Explorer graphical user interface to Trend Process data
  • View rich graphics to visualize the current and historical performance of your process with many hands-on activities 
  • Format is hands-on activity based, with a series of short PowerPoint based introductions to each topic
  • This instructor-led course gives opportunity for questions
  • Graphics creation element allows graphic designers to consult trainer on ways of achieving particular screen behavior

Prerequisites

  • Microsoft Windows platform basic user skills
  • Working knowledge of Aspen InfoPlus.21 database

Subsequent Courses

  • MES1200 – Calculation and Data Analysis for Engineers (3 days)
  • MES205 – Aspen InfoPlus.21: System Administration (2 days)MES271 – Aspen Production Record Manager: Configuring the Batch Area and Feed Application (2 days)

Class Schedule

Class Agenda

MES121: aspenONE Process Explorer: Using and Configuring

Overview

  • Visualize data with different client tools in InfoPlus.21
  • Use and understand aspenONE Process Explorer (a1PE)
  • Create trend plots within aspenONE Process Explorer
  • View High Performance Process Graphics
  • Use aspenONE Process Explorer Analytics
  • Explain aspenONE Process Explorer functionality in the web and mobile environment

Viewing Trend Data Using aspenONE Process Explorer
  • Start aspenONE Process Explorer
  • Begin a new trend plot
  • Bring Aspen InfoPlus.21 database items into the plot
  • Configure the Legend
  • Save a plot
  • Reload an existing plot
  • Set Default Data Source
  • Perform Ad Hoc Calculations
  • View KPI Trend and XY Chart
  • Workshop: Create and Edit a Trend Plot
  • Workshop: Filter Tags and Customize a Trend Plot
  • Workshop: Export Tag Data and Explore New Plot Types
  • Workshop: Create an XY Chart and Dashboard
  • Workshop: Create a KPI Trend

aspenONE Search
  • Access aspenONE Search page
  • View data from different Data Sources
  • Perform searches for
    • Tags
    • Graphics
    • Plots
    • APRM characteristics and aliases
    • S95 aliases
  • Workshop: Use the aspenONE Tag Search

Controlling the Display of Trend Data in a Plot
  • Modify the features of the Timeline Control
  • Use the Time Shift feature
  • Zoom in a Plot
  • Add Annotations to a Plot
  • Workshop: Adjust the Plot Timespan
  • Workshop: Analyze Data of Interest

Customizing the Plot and Legend Environment
  • Customize the plot environment by changing certain properties exhibited by
    • Plot Area
    • Timeline
    • Pens
  • Use Scaling and Sampling features in trend plots
  • Define Aggregates and how to use them
  • Workshop:  Customize the Plot Environment
  • Workshop:  Create an Aggregate Calculation

Event Plots
  • Identify and describe the functionality of the Event plots
    • Single Event
    • Event Overlay
    • Multi-Event Plot
  • Populate Event Plots with:
    • Production Record (APRM) events
    • Alarm events
    • Comment events
  • Workshop: Populate a Single Event Plot with APRM Events
  • Workshop: Analyze Anomalies with Ad-Hoc Events
aspenONE Alerts
  • Configure Alarm Alerts
  • Configure the Alert Subscription
  • Access the Alerts page
  • Visualize Alerts in aspenONE Process Explorer
  • Workshop: Configuring and Monitoring Alerts


Creating Process Graphics: Graphic Studio
  • Describe the Graphic Studio Environment
  • Create graphics using static and dynamic data objects
  • Link objects to Aspen InfoPlus.21 tags
  • Create symbols and add images to graphics
  • Examine scripting events in graphics
  • Display graphics within aspenONE Process Explorer
  • Workshop: Create a New Project and Graphic
  • Workshop: Add Real-time Data Objects
  • Workshop: Add Dashboard Components to a Graphic
  • Workshop: Implement Actions and Animations
  • Workshop: Append Symbols and Images to a Graphic
Creating Process Graphics: Process Graphics Editor
  • Describe the Process Graphics Editor
  • Create Static Objects
  • Import library items
  • Display dynamic live point data
  • Change the color of an Object using Animation
  • Build a hot-link
  • Public the graphics to aspenONE Process Explorer
  • Workshop: Create a Process Graphic

aspenONE Process Explorer Analytics
  • Describe the purpose and functionality of the Analytics Plots
  • View Overall Equipment Effectiveness (OEE) records using:
    • Waterfall Chart
    • Donut Chart
    • Pareto Chart
  • Use the Events Table to Enter Event Data
  • Edit and delete Events
  • Workshop: Create and Implement an OEE Chart
KPI Hierarchies
  • Describe a KPI Hierarchy
  • Build a KPI Hierarchy in mMDM
  • Perform Ad Hoc Calculations
  • View KPI Trend and XY Chart
Appendix A: OEE Data Records and Configuration
  • Configure OEE Definition Records in Aspen InfoPlus.21 (IP.21) database
Appendix B: Pattern Discovery and Recognition
  • Pattern Discovery and Pattern Recognition
Appendix C: SPC Plots
  • Understand the basic concepts of Statistical Process Control (SPC)
  • Measure the Return on Investment (ROI) of a Real-Time SPC Solution
  • Create ad hoc plots, configure plot settings, and view results

Aspen Technology, Inc. awards Continuing Education Units (CEUs) for training classes conducted by our organization. One CEU is granted for every 10 hours of class participation.